Thermometry of Silicon Nanoparticles

Current thermometry techniques lack the spatial resolution required to see the temperature gradients in typical, highly-scaled modern transistors. As a step toward addressing this problem, we have measured the temperature dependence of the volume plasmon energy in silicon nanoparticles from room temperature to 1250$^\circ$C, using a chip-style heating sample holder in a scanning transmission electron microscope (STEM) equipped with electron energy loss spectroscopy (EELS). The plasmon energy changes as expected for an electron gas subject to the thermal expansion of silicon. Reversing this reasoning, we find that measurements of the plasmon energy provide an independent measure of the nanoparticle temperature consistent with that of the heater chip's macroscopic heater/thermometer to within the 5\% accuracy of the chip thermometer's calibration. Thus silicon has the potential to provide its own, high-spatial-resolution thermometric readout signal via measurements of its volume plasmon energy. Furthermore, nanoparticles in general can serve as convenient nanothermometers for \emph{in situ} electron microscopy experiments.Comment: 6 pages, 3 figure

Electron beam-induced current imaging with two-angstrom resolution.

An electron microscope's primary beam simultaneously ejects secondary electrons (SEs) from the sample and generates electron beam-induced currents (EBICs) in the sample. Both signals can be captured and digitized to produce images. The off-sample Everhart-Thornley detectors that are common in scanning electron microscopes (SEMs) can detect SEs with low noise and high bandwidth. However, the transimpedance amplifiers appropriate for detecting EBICs do not have such good performance, which makes accessing the benefits of EBIC imaging at high-resolution relatively more challenging. Here we report lattice-resolution imaging via detection of the EBIC produced by SE emission (SEEBIC). We use an aberration-corrected scanning transmission electron microscope (STEM), and image both microfabricated devices and standard calibration grids

Electron Transport Driven by Nonequilibrium Magnetic Textures

Spin-polarized electron transport driven by inhomogeneous magnetic dynamics is discussed in the limit of a large exchange coupling. Electron spins rigidly following the time-dependent magnetic profile experience spin-dependent fictitious electric and magnetic fields. We show that the electric field acquires important corrections due to spin dephasing, when one relaxes the spin-projection approximation. Furthermore, spin-flip scattering between the spin bands needs to be taken into account in order to calculate voltages and spin accumulations induced by the magnetic dynamics. A phenomenological approach based on the Onsager reciprocity principle is developed, which allows us to capture the effect of spin dephasing and make a connection to the well studied problem of current-driven magnetic dynamics. A number of results that recently appeared in the literature are related and generalized.Comment: 4 pages, 1 figur

Tree-level electron-photon interactions in graphene

Graphene's low-energy electronic excitations obey a 2+1 dimensional Dirac Hamiltonian. After extending this Hamiltonian to include interactions with a quantized electromagnetic field, we calculate the amplitude associated with the simplest, tree-level Feynman diagram: the vertex connecting a photon with two electrons. This amplitude leads to analytic expressions for the 3D angular dependence of photon emission, the photon-mediated electron-hole recombination rate, and corrections to graphene's opacity $\pi \alpha$ and dynamic conductivity $\pi e^2/2 h$ for situations away from thermal equilibrium, as would occur in a graphene laser. We find that Ohmic dissipation in perfect graphene can be attributed to spontaneous emission.Comment: 5 pages, 3 figure

Electron tomography at 2.4 {\AA} resolution

Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 {\AA} has been demonstrated(6). To reveal the 3D structure of thin samples, electron tomography is the method of choice(7-11), with resolutions of ~1 nm^3 currently achievable(10,11). Recently, discrete tomography has been used to generate a 3D atomic reconstruction of a silver nanoparticle 2-3 nm in diameter(12), but this statistical method assumes prior knowledge of the particle's lattice structure and requires that the atoms fit rigidly on that lattice. Here we report the experimental demonstration of a general electron tomography method that achieves atomic scale resolution without initial assumptions about the sample structure. By combining a novel projection alignment and tomographic reconstruction method with scanning transmission electron microscopy, we have determined the 3D structure of a ~10 nm gold nanoparticle at 2.4 {\AA} resolution. While we cannot definitively locate all of the atoms inside the nanoparticle, individual atoms are observed in some regions of the particle and several grains are identified at three dimensions. The 3D surface morphology and internal lattice structure revealed are consistent with a distorted icosahedral multiply-twinned particle. We anticipate that this general method can be applied not only to determine the 3D structure of nanomaterials at atomic scale resolution(13-15), but also to improve the spatial resolution and image quality in other tomography fields(7,9,16-20).Comment: 27 pages, 17 figure

Polarized light emission from individual incandescent carbon nanotubes

We fabricate nanoscale lamps which have a filament consisting of a single multiwalled carbon nanotube. After determining the nanotube geometry with a transmission electron microscope, we use Joule heating to bring the filament to incandescence, with peak temperatures in excess of 2000 K. We image the thermal light in both polarizations simultaneously as a function of wavelength and input electrical power. The observed degree of polarization is typically of the order of 75%, a magnitude predicted by a Mie model of the filament that assigns graphene's optical conductance $\pi e^2/2 h$ to each nanotube wall.Comment: 5 pages, 4 figure